发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which attempts to uniformize a contact resistance of a wiring extending part to an underlying semiconductor substrate of multilayer wiring. SOLUTION: The semiconductor integrated circuit device has the semiconductor substrate, multilayer wirings laid in a plurality of layers on the semiconductor substrate, a hookup part 73 which is formed in the wiring extending region as an extension part of the wiring, and is composed of a pair of metal pieces opposed via a space of a given width, and a contact conductor 72 buried so as to penetrate the space of the metal piece pair of the hookup part. A space width of the metal piece pair of the hookup part is different between at least two layers of the wiring. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011054758(A) 申请公布日期 2011.03.17
申请号 JP20090202343 申请日期 2009.09.02
申请人 TOSHIBA CORP 发明人 NAGASHIMA HIROYUKI
分类号 H01L27/10;H01L21/768;H01L21/8242;H01L27/105;H01L27/108;H01L45/00;H01L49/00 主分类号 H01L27/10
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