发明名称 RADIATION THICKNESS METER
摘要 PURPOSE: A radiation thickness meter is provided to measure the thickness of radiation even when an object is moved to the light axis of the radiation. CONSTITUTION: A radiation thickness meter comprises a C-shaped frame(1d), a radiation source(1a), a main detector(1b), a sub detector(1c), a correction calculating unit(2a), and a thickness calculating unit(2b). The C-shaped frame is installed between objects vertically to a pass line plane for returning the objects. The radiation source is installed on one arm portion facing the C-shaped frame. The main detector detects the penetrating radiation. The sub detector detects the scattered beam scattered from the object around the main detector. The correction calculating unit calculates the difference of the sub detector and the main detector. The thickness calculating unit calculates the thickness from the output of the correction calculating unit.
申请公布号 KR20110028245(A) 申请公布日期 2011.03.17
申请号 KR20100089012 申请日期 2010.09.10
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OBARA SATOSHI
分类号 G01B15/02;G01N23/02 主分类号 G01B15/02
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