发明名称 Memory cell
摘要 A one-transistor (1T) NVRAM cell that utilizes silicon carbide (SiC) to provide both isolation of non equilibrium charge, and fast and non destructive charging/discharging. To enable sensing of controlled resistance (and many memory levels) rather than capacitance, the cell incorporates a memory transistor that can be implemented in either silicon or Sic. The 1T cell has diode isolation to enable implementation of the architectures used in the present flash memories, and in particular the NOR and the NAND arrays. The 1T cell with diode isolation is not limited to SiC diodes. The fabrication method includes the step of forming a nitrided silicon oxide gate on the Sic substrate and subsequently carrying out the ion implantation and then finishing the formation of a self aligned MOSFET.
申请公布号 EP2296151(A1) 申请公布日期 2011.03.16
申请号 EP20100183908 申请日期 2003.09.12
申请人 QS SEMICONDUCTOR AUSTRALIA PTY LTD 发明人 HARRISON, BARRY H.;DIMITRIJEV, SIMA
分类号 G11C11/36;G11C11/40;G11C11/401;G11C11/41;G11C16/04;H01L21/82;H01L21/8242;H01L21/8247;H01L27/10;H01L27/108;H01L27/115 主分类号 G11C11/36
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