发明名称 APPARATUS AND METHOD FOR INSPECTING DEFECT OF FLAT PANEL
摘要 PURPOSE: A device and method for inspecting defects of a flat board are provided to simplify the configuration of the device and to reduce manufacture costs by making the device for inspecting the upper and lower sides of a flat board by alternatively turning on lights. CONSTITUTION: A device for inspecting defects of a flat board comprises a photographing part(110), a first lighting part(120), a second lighting part(130), an illumination controller and an image separating part(170). The photographing device is arranged to be separated from the flat board moving in a preset scan direction. The photographing device produces inspection images by consecutively taking a picture of the surface of the flat board in order to detect the defects existing on the flat board. The first lighting part is arranged to be separated from the upper side of the flat board and emits light to the upper side of the flat board. The second lighting part is arranged to be separated from the lower-part of the flat board and emits light to the lower-part of the flat board. The illumination controller alternatively turns the first and second lighting parts according to the preset switching cycle based on the transition speed of the flat board.
申请公布号 KR20110026922(A) 申请公布日期 2011.03.16
申请号 KR20090084778 申请日期 2009.09.09
申请人 MACRON CO., LTD. 发明人 LEE, KIL JAE
分类号 G01N21/88;G02F1/13 主分类号 G01N21/88
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