发明名称 SEMICONDUCTOR DEVICE
摘要 Embodiments of the invention provide a semiconductor device having high reliability as they ease the thermal stress or a heat distortion or strain occurring during the manufacturing process or during operation, and the embodiments function with stability for a long time. A semiconductor device has a semiconductor substrate, an insulating ceramic plate on which the semiconductor substrate is mounted and stress buffer 40 that eases a thermal stress. The stress buffer is provided between the semiconductor substrate and the insulating ceramic plate and can be provided on a surface of the insulating ceramic plate that is opposite to a surface on which the semiconductor substrate is mounted. The stress buffer is formed from a structure including at least Al and a second phase. The second phase is Al4X where X is at least one element of alkaline earth metal elements.
申请公布号 EP2188835(B1) 申请公布日期 2011.03.16
申请号 EP20080807057 申请日期 2008.09.08
申请人 NISSAN MOTOR CO., LTD. 发明人 GEJIMA, FUMIHIKO;SAKAMOTO, HIROKI
分类号 H01L23/373 主分类号 H01L23/373
代理机构 代理人
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