发明名称 Method for characterizing x-ray detector materials using a Raman microscope
摘要 An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
申请公布号 US7907274(B2) 申请公布日期 2011.03.15
申请号 US20080179265 申请日期 2008.07.24
申请人 HOLOGIC, INC. 发明人 MAZZIO VICTOR
分类号 G01J3/44 主分类号 G01J3/44
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