发明名称 Semiconductor device fabrication method
摘要 Methods of fabricating a semiconductor device including a through-silicon via that is electrically insulated from the semiconductor substrate. An exemplary method includes preparing a semiconductor wafer including a semiconductor substrate, a semiconductor element, an interlayer insulating, pads that are electrically connected to the semiconductor element, and a protective film; forming upper terminals electrically connected to the pads; forming annular grooves below the pads and extending to the interlayer insulating film; forming an annular insulating layer in the annular grooves and forming a bottom insulating film on the bottom surface of the semiconductor substrate; forming electrode-forming extending to the pads; filling the electrode-forming holes with a conductive material to form through-silicon vias electrically connected to the pads; and forming lower terminals on the bottom insulating film electrically connected to the through-silicon vias.
申请公布号 US7906431(B2) 申请公布日期 2011.03.15
申请号 US20080272313 申请日期 2008.11.17
申请人 OKI SEMICONDUCTOR CO., LTD. 发明人 MISTUHASHI TOSHIRO
分类号 H01L21/28;H01L21/44 主分类号 H01L21/28
代理机构 代理人
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