发明名称 Compensated MEMS FTIR Spectrometer Architecture
摘要 A Micro Electro-Mechanical System (MEMS) spectrometer architecture compensates for verticality and dispersion problems using balancing interfaces. A MEMS spectrometer/interferometer includes a beam splitter formed on a first surface of a first medium at an interface between the first medium and a second medium, a first mirror formed on a second surface of the first medium, a second mirror formed on a third surface of the first medium and balancing interfaces designed to minimize both a difference in tilt angles between the surfaces and a difference in phase errors between beams reflected from the first and second mirrors.
申请公布号 US2011058180(A1) 申请公布日期 2011.03.10
申请号 US20100877888 申请日期 2010.09.08
申请人 SI-WARE SYSTEMS 发明人 KHALIL DIAA A.;MORTADA BASSEM;NABIL MOHAMED;MEDHAT MOSTAFA;SAADANY BASSAM A.
分类号 G01B9/02 主分类号 G01B9/02
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