METHOD FOR TREATING ELECTRODE PAD, AND METHOD FOR TESTING OPEN SHORT OF A SUBSTRATE WITH THE SAME

摘要

PURPOSE: An electrode pad processing method and an open short test method using the same are provided to complete the OS test efficiently by removing the electrode pad without the physical or chemical damage to the ceramic substrate. CONSTITUTION: A ceramic substrate is prepared(S110). Electrode pads are formed on the ceramic substrate with the conductive material including the carbon nanotube(S140). The electrode pads formed on the ceramic substrate are removed after the open short inspection of the ceramic substrate is performed.