发明名称 AUTOMATIC ANALYSIS DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem in an automatic analysis device for analyzing particle components contained in a specimen sampled from a person to be inspected, wherein it has been difficult to detect abnormal conditions of a section that does not perform operation such as movement and opening and closing. <P>SOLUTION: The automatic analysis device for analyzing a particle component contained in a specimen sampled from a person to be inspected includes a measurement section for measuring a specimen and acquiring measurement data, a controller for analyzing measurement data acquired by the measurement section and acquiring the analysis results of particle components contained in the specimen, and an information means for informing predetermined information, in which the controller controls the informing means so as to inform the abnormal condition indication of the measurement section, based on the acquisition frequency of the analysis results containing information related to the abnormal conditions of predetermined particle components. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011047911(A) 申请公布日期 2011.03.10
申请号 JP20090199054 申请日期 2009.08.28
申请人 SYSMEX CORP 发明人 MIZUMOTO TORU;TATSUYA HIROMOTO
分类号 G01N35/00;G01N15/14;G01N21/05;G01N21/15;G01N21/49;G01N21/64 主分类号 G01N35/00
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