发明名称 SALT, RESIST COMPOSITION, AND METHOD FOR FORMING RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a salt achieving even better line edge roughness (LER) in a formed pattern, a resist composition comprising the salt, and a method for forming a pattern. <P>SOLUTION: The salt is constituted of an anion of 1,3-diketone and an organic cation. The resist composition comprises the salt, an acid generating agent, and a resin. The method for forming a resist pattern includes (1) a process of applying the resist composition onto a substrate, (2) a process of removing a solvent from the resist composition applied onto the substrate to form a resist composition layer, (3) a process of exposing the resist composition layer to light using an exposure device, (4) a process of heating the resist composition layer having been exposed to light, and (5) a developing process of subjecting the resist composition layer having been heated to a developing process using a developing device. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011046696(A) 申请公布日期 2011.03.10
申请号 JP20100169151 申请日期 2010.07.28
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;FURUYAMA FUMIO;ANDO NOBUO
分类号 C07C49/14;C07C25/18;C07C381/12;C07D333/46;G03F7/004;G03F7/039;H01L21/027 主分类号 C07C49/14
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