发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that can be improved in yield by eliminating a step of an interlayer insulating film formed between a memory cell array region and a peripheral circuit region. SOLUTION: The semiconductor device has: a first region 4 in which a plurality of first elements 10 element-isolated by element isolation insulating films 2a and 2b are formed on a semiconductor substrate 1; a second region 5 which is arranged on the semiconductor substrate 1 adjacently to the first region 4 and in which a plurality of second elements 20 element-isolated by element isolation insulating films 2b and 2c are formed and less in height than the first elements 10; dummy insulating films 6c and 6d arranged at least partially on regions of the element isolation insulating films 2b and 2c in the second region 5; and an interlayer insulating film 7 formed over the first region 4 and second region 5. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011049402(A) |
申请公布日期 |
2011.03.10 |
申请号 |
JP20090197270 |
申请日期 |
2009.08.27 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
ISHIGURO HISASHI |
分类号 |
H01L27/115;H01L21/76;H01L21/8247;H01L27/10;H01L29/788;H01L29/792 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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