发明名称 SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that can be improved in yield by eliminating a step of an interlayer insulating film formed between a memory cell array region and a peripheral circuit region. SOLUTION: The semiconductor device has: a first region 4 in which a plurality of first elements 10 element-isolated by element isolation insulating films 2a and 2b are formed on a semiconductor substrate 1; a second region 5 which is arranged on the semiconductor substrate 1 adjacently to the first region 4 and in which a plurality of second elements 20 element-isolated by element isolation insulating films 2b and 2c are formed and less in height than the first elements 10; dummy insulating films 6c and 6d arranged at least partially on regions of the element isolation insulating films 2b and 2c in the second region 5; and an interlayer insulating film 7 formed over the first region 4 and second region 5. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011049402(A) 申请公布日期 2011.03.10
申请号 JP20090197270 申请日期 2009.08.27
申请人 RENESAS ELECTRONICS CORP 发明人 ISHIGURO HISASHI
分类号 H01L27/115;H01L21/76;H01L21/8247;H01L27/10;H01L29/788;H01L29/792 主分类号 H01L27/115
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