发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A nonvolatile semiconductor memory apparatus and a manufacturing method thereof are provided to improve the yield rate by restraining the short generated by the bending of the word line conductive layer. CONSTITUTION: A word line conductive layer(41a ~ 41d) is laminated on the first area and the second area. A semiconductor layer comprises a pillar(45A) extended in a direction perpendicular to the substrate. A charge storing layer is formed between the conductive layer and the side of pillar. A first trench is arranged to have the first pitch in the first direction on the first area.</p>
申请公布号 KR20110025628(A) 申请公布日期 2011.03.10
申请号 KR20100086616 申请日期 2010.09.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HIGASHI KAZUYUKI
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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