摘要 |
PURPOSE: A coupler for a probe card is provided to increase the electrical contact property of a probe card and to increase the quality of the probe card in order to increase working productivity by simply connecting a pin and a socket. CONSTITUTION: A connector connects a main board and a sub board of a probe card. A concave socket(132) is formed in one side of the main board(120). An arm combiner(130) is formed in a diameter magnification unit. A pin in which is perpendicularly projected is located to a socket of the main board. A male combiner(150) is formed in a diameter reducing unit. An inclination angle of the diameter magnification unit is formed in the pin of the male combiner. An internal diameter of the socket of the main board accords with a pin external diameter of the substrate. |