发明名称 EXPOSURE APPARATUS, EXPOSURE METHOD AND DEVICE MANUFACTURING METHOD
摘要 An exposure apparatus EX is provided with a measuring unit 60 which measures at least one of property and components of a liquid LQ in a state that a liquid immersion area LR is formed on an object different from a substrate P to be exposed. There is provided an exposure apparatus which can accurately perform exposure process and measurement process through the liquid by judging the state of the liquid in advance and by performing a procedure as appropriate.
申请公布号 EP1821338(A4) 申请公布日期 2011.03.09
申请号 EP20050814747 申请日期 2005.12.09
申请人 NIKON CORPORATION 发明人 KIDA, YOSHIKI
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
代理机构 代理人
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