发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: A nonvolatile semiconductor memory device and a method for manufacturing the same are provided to consecutively form a memory gate insulating layer, a drain side gate insulating layer, and a source side gate insulating layer, thereby simplifying processes. CONSTITUTION: The first semiconductor layer comprises a pillar expanded in a laminating direction on a substrate. The first charge storing layer(55b) surrounds the pillar. The first conductive layer(51) is laminated on the substrate to surround the first charge storing layer. The second semiconductor layer(57) is expanded in a laminating direction while the second semiconductor layer contacts an upper surface of the pillar. The second charge storing layer(56b) surrounds the second semiconductor layer.
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申请公布号 |
KR20110025038(A) |
申请公布日期 |
2011.03.09 |
申请号 |
KR20100019366 |
申请日期 |
2010.03.04 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KIDOH MASARU;KATSUMATA RYOTA;KITO MASARU;FUKUZUMI YOSHIAKI;TANAKA HIROYASU;KOMORI YOSUKE;ISHIDUKI MEGUMI;FUJIWARA TOMOKO;AOCHI HIDEAKI;KIRISAWA RYOUHEI;MIKAJIRI YOSHIMASA;OOTA SHIGETO |
分类号 |
H01L27/115;G11C16/00;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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