| 摘要 |
Highly spatially resolved optical microscopy or spectroscopy of a sample 1.8 is performed at rapid imaging rates beyond the diffraction limit (4, figure 1b). It is computer-assisted by reconstruction of the originally formed diffraction image by back-transforming computer software after diffraction image data have been directly recorded by a large array 3 of very small pixel sensors to quantitatively measure the light intensity profile. |
