发明名称 Photoresist topcoat for a photolithographic process
摘要 A composition that includes functionalized polyhedral oligomeric silsesquioxanes derivatives of the formulas TmR3 where m is equal to 8, 10 or 12 and QnMnR1,R2,R3 where n is equal to 8, 10 or 12 are provided. The functional groups include aqueous base soluble moieties. Mixtures of the functionalized polyhedral oligomeric silsesquioxanes derivatives are highly suitable as a topcoat for photoresist in photolithography and immersion photolithography applications.
申请公布号 US7901868(B2) 申请公布日期 2011.03.08
申请号 US20080128171 申请日期 2008.05.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ALLEN ROBERT DAVID;SOORIYAKUMARAN RUTNAM;SUNDBERG LINDA KARIN
分类号 G03F7/09;C08G77/38;G03C1/76;G03F7/11 主分类号 G03F7/09
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