发明名称 Self-diagnostic circuit and self-diagnostic method for detecting errors
摘要 A self-diagnostic circuit includes a setting unit receiving a plurality of detection signals generated in an integrated circuit device, and determining a type of detection signal to be detected among the received plurality of detection signals. A counter is coupled to the setting unit and counts a number of a signal corresponding to the type of the detection signal to be detected.
申请公布号 US7904771(B2) 申请公布日期 2011.03.08
申请号 US20080292862 申请日期 2008.11.26
申请人 RENESAS ELECTRONICS CORPORATION 发明人 MOCHIZUKI HIDEO
分类号 G01R31/28 主分类号 G01R31/28
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