发明名称 Activating a design test mode in a graphics card having multiple execution units to bypass a host cache and transfer test instructions directly to an instruction cache
摘要 Provided are a method and system for activating a design test mode in a graphics card having multiple execution units. A design test mode is activated in a graphics module comprising multiple execution units coupled to a cache on a bus. The bus is configured to return test instructions from the cache to the execution units in response to a request from one execution unit for the test instructions from the cache in the design test mode. The execution units execute the test instructions during the design test mode. Interrupts are prevented during the design test mode.
申请公布号 US7904701(B2) 申请公布日期 2011.03.08
申请号 US20070759840 申请日期 2007.06.07
申请人 INTEL CORPORATION 发明人 BABELLA ANTHONY;WONG ALLAN;CHENEY LANCE;RAUCHFUSS BRIAN D.
分类号 G06F9/00;G06F11/00 主分类号 G06F9/00
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