发明名称 Integrated circuit well isolation structures
摘要 An integrated circuit is provided with transistor body regions that may be independently biased. Some of the bodies may be forward body biased to lower threshold voltages and increase transistor switching speed. Some of the bodies may be reverse body biased to increase threshold voltages and decrease leakage current. The integrated circuit may be formed on a silicon substrate. Body bias isolation structures may be formed in the silicon substrate to isolate the bodies from each other. Body bias isolation structures may be formed from shallow trench isolation trenches. Doped regions may be formed at the bottom of the trenches using ion implantation. Oxide may be used to fill the trenches above the doped region. A deep well may be formed under the body regions. The deep well may contact the doped regions that are formed at the bottom of the trenches.
申请公布号 US7902611(B1) 申请公布日期 2011.03.08
申请号 US20070998016 申请日期 2007.11.27
申请人 ALTERA CORPORATION 发明人 RAHIM IRFAN;JENSEN BRADLEY;MCELHENY PETER J.
分类号 H01L21/70;H01L23/52;H01L29/00 主分类号 H01L21/70
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