发明名称 Methods of fabricating magnetoresistance sensors pinned by an etch induced magnetic anisotropy
摘要 Magnetoresistance sensors with magnetic pinned layers that are pinned by anisotropic etch induced magnetic anisotropies and methods for fabricating the magnetoresistance sensors are provided. The method comprises forming a seed layer structure. The seed layer is etched to form an anisotropic etch along a top surface of the seed layer. A magnetic pinned layer is formed on the top surface of the seed layer structure. The anisotropic etch on the top surface of the seed layer structure induces a magnetic anisotropy in the magnetic pinned layer, which pins the magnetization of the magnetic pinned layer structure.
申请公布号 US7900342(B2) 申请公布日期 2011.03.08
申请号 US20070678427 申请日期 2007.02.23
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS, B.V. 发明人 FREITAG JAMES M.;PINARBASI MUSTAFA M.
分类号 G11B5/127;H04R31/00 主分类号 G11B5/127
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