发明名称 |
EVALUATION DEVICE OF SHEAR STRENGTH OF BUMP |
摘要 |
PURPOSE: A device for evaluating the shear strength of a bump is provided to measure the coupling reliability of a bump constituting C4 of a semiconductor, a CPU, and a chip set. CONSTITUTION: A device for evaluating the shear strength of a bump comprises a plate(101), an elastic member(105), a transmission member(111), and a stopper(110). The plate fixes a substrate(106) and a test member(108) coupled with a bump(107). The plate comprises an insertion groove(109) opened to one side. The elastic member generates the movement of a hammer with external force. The transmission member is placed in the insertion groove to be movable. The transmission member transfers the elastic force to the test member. |
申请公布号 |
KR20110022886(A) |
申请公布日期 |
2011.03.08 |
申请号 |
KR20090080380 |
申请日期 |
2009.08.28 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
LEE, YOUNG KWAN;MIN, BYUNG SEUNG;HWANG, SU HYUNG;PANG, JUNG YOUN;KIM, CHI SEONG;LEE, DONG JUN |
分类号 |
G01N3/24;G01N3/02 |
主分类号 |
G01N3/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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