发明名称 EVALUATION DEVICE OF SHEAR STRENGTH OF BUMP
摘要 PURPOSE: A device for evaluating the shear strength of a bump is provided to measure the coupling reliability of a bump constituting C4 of a semiconductor, a CPU, and a chip set. CONSTITUTION: A device for evaluating the shear strength of a bump comprises a plate(101), an elastic member(105), a transmission member(111), and a stopper(110). The plate fixes a substrate(106) and a test member(108) coupled with a bump(107). The plate comprises an insertion groove(109) opened to one side. The elastic member generates the movement of a hammer with external force. The transmission member is placed in the insertion groove to be movable. The transmission member transfers the elastic force to the test member.
申请公布号 KR20110022886(A) 申请公布日期 2011.03.08
申请号 KR20090080380 申请日期 2009.08.28
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 LEE, YOUNG KWAN;MIN, BYUNG SEUNG;HWANG, SU HYUNG;PANG, JUNG YOUN;KIM, CHI SEONG;LEE, DONG JUN
分类号 G01N3/24;G01N3/02 主分类号 G01N3/24
代理机构 代理人
主权项
地址