发明名称 |
FUSE IN SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device fuse and manufacturing method thereof are provided to prevent a repair fuse defect due to migration by comprising a blowing part which has smaller diffusion coefficient than the pad of the fuse. CONSTITUTION: A wiring layer(102) is formed on a substrate(101). An insulating layer(103) is formed to cover the front of the structure including the wiring layer. A plug(104) connects the wiring layer and a conductive pattern(105) and passes through the insulation layer. The conductive pattern comprises a blowing part(105B) and a pad(105A).
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申请公布号 |
KR20110022240(A) |
申请公布日期 |
2011.03.07 |
申请号 |
KR20090079749 |
申请日期 |
2009.08.27 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, HAE JUNG;CHO, YONG TAE;LEE, KANG POK |
分类号 |
H01L23/62;H01L21/82 |
主分类号 |
H01L23/62 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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