| 摘要 |
PURPOSE: A device and a method for inspecting a scratch are provided to obtain the high intensity of radiation by re-reflecting light reflected from an object for an inspection. CONSTITUTION: A device(1) for inspecting a scratch comprises lighting units(30a,30b), cameras(20a,20b), and reflective mirrors(40a,40b). The lighting units irradiate light to an object. The cameras recognize light scattered from scratches on the surface of the object. The reflective mirrors re-reflect the light reflected from the surface of the object. The lighting units, the cameras, and the reflective mirrors are arranged in the top and bottom of the object.
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