发明名称 UV IRRADIANCE MONITORING IN SEMICONDUCTOR PROCESSING USING A TEMPERATURE DEPENDENT SIGNAL
摘要 In a UV process tool for semiconductor processing, a temperature-dependent signal may be used as a monitor signal for determining the momentary irradiance of the UV radiation source. Consequently, a fast and reliable monitoring and/or controlling of the irradiance of UV process tools may be accomplished.
申请公布号 US2011053294(A1) 申请公布日期 2011.03.03
申请号 US20100854995 申请日期 2010.08.12
申请人 MAYER ULRICH;SCHEPERS THORSTEN 发明人 MAYER ULRICH;SCHEPERS THORSTEN
分类号 H01L21/66;G21K5/00 主分类号 H01L21/66
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