发明名称 MICROSCOPE MEASUREMENT SYSTEM
摘要 A microscope measurement system including: an optical microscope including a microscope body and an objective connected to the microscope body; a chamber including a support mechanism holding an object to be examined therein, the chamber including an opening inserting the objective into the chamber such that the objective is located essentially within the chamber and the microscope body is located essentially outside of the chamber; a sealing mechanism that provides an essentially gas-tight connection between the optical microscope and the chamber such that the chamber is sealed.
申请公布号 US2011051235(A1) 申请公布日期 2011.03.03
申请号 US20070599764 申请日期 2007.05.15
申请人 SONY DEUTSCHLAND GMBH 发明人 MITEVA TZENKA;MINKIN PIOTR;NELLES GABRIELE;YASUDA AKIO
分类号 G02B21/24;G01Q60/18 主分类号 G02B21/24
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