发明名称 SEMICONDUCTOR DEVICE
摘要 In Trench-Gate Fin-FET, in order that the advantage which is exerted in Fin-FET can be sufficiently taken even if a transistor becomes finer and, at the same time, decreasing of on-current can be suppressed by saving a sufficiently large contact area in the active region, a fin width 162 of a channel region becomes smaller than a width 161 of an active region.
申请公布号 US2011049599(A1) 申请公布日期 2011.03.03
申请号 US20100869214 申请日期 2010.08.26
申请人 ELPIDA MEMORY, INC. 发明人 TAKETANI HIROAKI
分类号 H01L27/108;H01L27/06 主分类号 H01L27/108
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