发明名称 CHEMICAL MECHANICAL POLISHING WITH MULTI-ZONE SLURRY DELIVERY
摘要 Chemical-mechanical polishing or planarization (CMP) is enhanced with multi-zone slurry delivery. A polishing pad is provided that contacts with the work piece, and a multi-zone platen is displaced proximate to the polishing pad to facilitate slurry delivery. The platen includes multiple fluid distribution layers that each include a fluid-distributing channel extending from a fluid source to a distribution point on layer. The distribution points on each of the fluid distribution layers correspond to different locations on the polishing surface to thereby create multiple fluid-delivery zones on the pad.
申请公布号 KR20110020915(A) 申请公布日期 2011.03.03
申请号 KR20117001099 申请日期 2009.06.15
申请人 NOVELLUS SYSTEMS, INC. 发明人 O'MOORE FERGAL;SCHULTZ STEVE
分类号 B24B37/04;H01L21/304 主分类号 B24B37/04
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