发明名称 |
Control System and Semiconductor Device Used Therein |
摘要 |
The present invention aims to provide a control system which is capable of building high-precision current detecting means in a single-chip LSI and can be realized at a lower cost, and a semiconductor device used in the control system. Drive circuits are provided inside the same semiconductor chip. The drive circuits are equipped with: current detecting shunt resistors each of which is provided in each of the drive circuits and detects a current flowing through a load, the current detecting shunt resistors being provided within a semiconductor chip by the same process; a dummy resistor provided within the semiconductor chip by the same process as the current detecting shunt resistors; and a calibration reference externally attached to the semiconductor chip and connected to the dummy resistor. A correcting means corrects the values of currents that flow through the current detecting shunt resistors, using the dummy resistor and the calibration reference.
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申请公布号 |
US2011049988(A1) |
申请公布日期 |
2011.03.03 |
申请号 |
US20100855428 |
申请日期 |
2010.08.12 |
申请人 |
HITACHI AUTOMOTIVE SYSTEMS, LTD. |
发明人 |
KANEKAWA NOBUYASU;HIROTSU TEPPEI;TANABE ITARU;MIYAOKA SHUICHI;OURA RYOICHI |
分类号 |
H02J4/00 |
主分类号 |
H02J4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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