发明名称 |
WAFER LEVEL CHIP SCALE PACKAGE AND METHOD FOR FABRICATING THE SAME |
摘要 |
<p>PURPOSE: A wafer level chip scale package and a method for fabricating the same are provided to prevent a pattern defect due to plating which is generated in a rewiring and a rewiring pad at the same time by forming a rewiring and a rewiring pad through an additional process. CONSTITUTION: In a wafer level chip scale package and a method for fabricating the same, a bonding pad is formed on the top of a semiconductor chip(20). A first insulating layer(23) is formed on the top of the semiconductor chip. A rewiring pad(25) is spaced from the boding pad and is formed in the first insulating layer. A surface plating layer(26) is formed on the top and side of the rewiring pad. A rewiring line(27) electrically connects the bonding pad and the rewiring pad.</p> |
申请公布号 |
KR20110020545(A) |
申请公布日期 |
2011.03.03 |
申请号 |
KR20090078213 |
申请日期 |
2009.08.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, SEONG CHEOL;PARK, CHANG JUN |
分类号 |
H01L23/488 |
主分类号 |
H01L23/488 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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