| 摘要 |
This atomic force microscope has a probe for surface analysis of a sample (E), comprising a support body and an elastically deformable strip linked to the body, the strip being provided with a tip designed to come into contact with the sample (E) to be analysed. The microscope also has a mechanism for relative displacement of the analysis probe with respect to the surface of the sample (E), a detector for determining the position of the strip, and elements for vibrating the strip. These means for vibrating the strip include elements for conduction of electricity along a continuous path forming a loop, an alternating-current generator, and a magnetic-field source designed to set up a magnetic field ({right arrow over (B) in the region of the strip of the analysis probe. |
