发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which is suitable to form a fine hole pattern. <P>SOLUTION: A mask pattern includes a plurality of opening patterns which are transparent regions having centers arranged on each of a plurality of parallel lines, which have first intervals in a first direction and extend in a second direction perpendicular to the first direction, at second intervals in the second direction, and the plurality of opening patterns arranged on the adjacent ones of the plurality of parallel lines have centers displaced from each other by 1/n (n is an integer of &ge;3) of the second interval in the second direction, and an illumination shape of an illumination light source is set so that three of diffracted light components from a photomask pass through a pupil of a projection optical system. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011044721(A) 申请公布日期 2011.03.03
申请号 JP20100225050 申请日期 2010.10.04
申请人 TOSHIBA CORP 发明人 FUKUHARA KAZUYA;HASHIMOTO TAKAKI;KAI YASUNOBU;MASUKAWA KAZUYUKI
分类号 H01L21/027;G03F1/00;G03F1/68;G03F7/20 主分类号 H01L21/027
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