发明名称 ACCUMULATION TYPE FINFET, CIRCUITS AND FABRICATION METHOD THEREOF
摘要 A FinFET includes a substrate and a fin structure on the substrate. The fin structure includes a channel between a source and a drain, wherein the source, the drain, and the channel have the first type dopant. The channel includes a Ge, SiGe, or III-V semiconductor. A gate dielectric layer is located over the channel and a gate is located over the gate dielectric layer.
申请公布号 US2011049613(A1) 申请公布日期 2011.03.03
申请号 US20100757271 申请日期 2010.04.09
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YEH CHIH CHIEH;CHANG CHIH-SHENG;WANN CLEMENT HSINGJEN
分类号 H01L29/78;H01L21/336;H01L27/088 主分类号 H01L29/78
代理机构 代理人
主权项
地址