发明名称 Inspection Apparatus, Lithographic Apparatus and Method of Measuring a Property of a Substrate
摘要 Scatterometers making use of a Glan-laser polarizer are described. The use of Glan-laser polarizers as described generally results in an improved extinction ratio and use over a greater range of wavelengths when compared with dielectric polarizers.
申请公布号 US2011051129(A1) 申请公布日期 2011.03.03
申请号 US20090922578 申请日期 2009.03.16
申请人 ASML NETHERLANDS B.V. 发明人 HUGERS RONALD FRANCISCUS HERMAN
分类号 G01N21/23 主分类号 G01N21/23
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