发明名称 |
METHOD FOR ALIGNING A SUBSTRATE |
摘要 |
PURPOSE: A method for aligning a substrate is provided to align a substrate using a location of a predicted virtual alignment mark, thereby reducing alignment defects and errors. CONSTITUTION: A substrate(100) is placed in a stage(200). A stage alignment mark for aligning a substrate is formed on the stage. A calibration unit(300) arranges the substrate at a target location on the stage. A vision system(400) photographs the stage alignment mark and the substrate by a camera unit(410). An alignment controller(500) controls an operation of the calibration unit using an image photographed by the vision system.
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申请公布号 |
KR20110019990(A) |
申请公布日期 |
2011.03.02 |
申请号 |
KR20090077639 |
申请日期 |
2009.08.21 |
申请人 |
AP SYSTEMS INC. |
发明人 |
OH, SEUNG HUN;ROEW, SUNG HWA;PARK, HYUN KEUK;AHN, CHI HONG |
分类号 |
H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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