发明名称 METHOD FOR ALIGNING A SUBSTRATE
摘要 PURPOSE: A method for aligning a substrate is provided to align a substrate using a location of a predicted virtual alignment mark, thereby reducing alignment defects and errors. CONSTITUTION: A substrate(100) is placed in a stage(200). A stage alignment mark for aligning a substrate is formed on the stage. A calibration unit(300) arranges the substrate at a target location on the stage. A vision system(400) photographs the stage alignment mark and the substrate by a camera unit(410). An alignment controller(500) controls an operation of the calibration unit using an image photographed by the vision system.
申请公布号 KR20110019990(A) 申请公布日期 2011.03.02
申请号 KR20090077639 申请日期 2009.08.21
申请人 AP SYSTEMS INC. 发明人 OH, SEUNG HUN;ROEW, SUNG HWA;PARK, HYUN KEUK;AHN, CHI HONG
分类号 H01L21/68 主分类号 H01L21/68
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