发明名称 |
Control of instruments, in particular of electron microscopes |
摘要 |
A memory stores possible values of operating parameters corresponding to user controllable parameter e.g. accelerating voltage of electrode (12). A tuner alters the operating parameter value selected from memory and the memory is updated accordingly such that the adjusted value of operating parameter is subsequently selected from the memory if the same value of user controllable parameter is chosen again. An independent claim is included for a scanning charged particle beam instrument. |
申请公布号 |
EP1403901(A3) |
申请公布日期 |
2011.03.02 |
申请号 |
EP20030254620 |
申请日期 |
2003.07.24 |
申请人 |
CARL ZEISS NTS GMBH |
发明人 |
PREIKZSAS, DIRK;HUBBARD, DAVID RALPH |
分类号 |
H01J37/26;H01J37/28 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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