发明名称 Structure for plasma processing chamber, plasma processing chamber, plasma processing apparatus, and plasma processing chamber component
摘要 A structure for a plasma processing chamber which makes it possible to control the potential therein and simplify the construction of the plasma processing chamber. A gas-introducing showerhead 34 is disposed in the plasma processing chamber 10 including a container 11 having a process space S for receiving a semiconductor wafer W, and a susceptor 12 disposed in the container 11, for mounting the received semiconductor wafer W thereon. The susceptor 12 is connected to high-frequency power supplies 20 and 46. An electrode support 39 of the gas-introducing showerhead 34 is electrically grounded. An electrically floating top electrode plate 38 of the gas-introducing showerhead 34 is disposed between the electrode support 39 and the process space S. The top electrode plate 38 has a surface exposed to the process space S. An insulating film 48 is formed of a dielectric material and disposed between the electrode support 39 and the top electrode plate 38.
申请公布号 US7895970(B2) 申请公布日期 2011.03.01
申请号 US20060529372 申请日期 2006.09.29
申请人 TOKYO ELECTRON LIMITED 发明人 HONDA MASANOBU;HAYAMI TOSHIHIRO;MATSUI YUTAKA
分类号 C23C16/00;C23F1/00;H01L21/306 主分类号 C23C16/00
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