发明名称 Integrated nitride and silicon carbide-based devices and methods of fabricating integrated nitride-based devices
摘要 Monolithic electronic device including a common nitride epitaxial layer are provided. A first type of nitride device is provided on the common nitride epitaxial layer including a first at least one implanted n-type region on the common nitride epitaxial layer. The first at least one implanted n-type region has a first doping concentration greater than a doping concentration of the common nitride epitaxial layer. A second type of nitride device, different from the first, including a second at least one implanted n-type region is provided on the common nitride epitaxial layer. The second at least one implanted n-type region is different from the first at least one implanted n-type region and has a second doping concentration that is greater than the doping concentration of the common nitride epitaxial layer. First and second pluralities of contacts respectively define first and second electronic devices on the common nitride epitaxial layer.
申请公布号 US7898047(B2) 申请公布日期 2011.03.01
申请号 US20080051303 申请日期 2008.03.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHEPPARD SCOTT T.
分类号 H01L29/84 主分类号 H01L29/84
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