发明名称 Small spot and high energy resolution XRF system for valence state determination
摘要 An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.
申请公布号 US7899154(B2) 申请公布日期 2011.03.01
申请号 US20080531142 申请日期 2008.03.14
申请人 X-RAY OPTICAL SYSTEMS, INC. 发明人 CHEN ZEWU;DANHONG LI
分类号 G01N23/223 主分类号 G01N23/223
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