发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to improve the throughput by processing the oxide semiconductor layer, located on a gate insulating layer, into an island shape oxide semiconductor layer using a wet etching technique. CONSTITUTION: A gate electrode(202) is formed on a substrate(200) with an insulating surface. A gate insulating layer(204) is formed on the gate electrode. An oxide semiconductor layer(206) is formed on the gate insulating layer. A resist-mask(208) is formed on the oxide semiconductor layer. The oxide semiconductor layer is etched selectively, and an island shape oxide semiconductor layer(210) is formed.
申请公布号 KR20110019413(A) 申请公布日期 2011.02.25
申请号 KR20110012692 申请日期 2011.02.14
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 SUZAWA HIDEOMI;SASAGAWA SHINYA;MURAOKA TAIGA
分类号 H01L29/786;G02F1/136 主分类号 H01L29/786
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