发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to improve the throughput by processing the oxide semiconductor layer, located on a gate insulating layer, into an island shape oxide semiconductor layer using a wet etching technique. CONSTITUTION: A gate electrode(202) is formed on a substrate(200) with an insulating surface. A gate insulating layer(204) is formed on the gate electrode. An oxide semiconductor layer(206) is formed on the gate insulating layer. A resist-mask(208) is formed on the oxide semiconductor layer. The oxide semiconductor layer is etched selectively, and an island shape oxide semiconductor layer(210) is formed. |
申请公布号 |
KR20110019413(A) |
申请公布日期 |
2011.02.25 |
申请号 |
KR20110012692 |
申请日期 |
2011.02.14 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
SUZAWA HIDEOMI;SASAGAWA SHINYA;MURAOKA TAIGA |
分类号 |
H01L29/786;G02F1/136 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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