发明名称 ION ANALYZING APPARATUS AND ION ANALYZING METHOD
摘要 An ion analyzing apparatus includes a sensor; a counter electrode having openings, the counter electrode being positioned so as to substantially surround the sensor; and a bias generating circuit coupled to the sensor, wherein the sensor includes quartz crystal and a pair of electrodes positioned on surface of the quartz crystal, and one of the pair of electrodes is coupled to the bias generating circuit.
申请公布号 US2011042239(A1) 申请公布日期 2011.02.24
申请号 US20100856142 申请日期 2010.08.13
申请人 FUJITSU LIMITED 发明人 TAKASU RYOZO
分类号 G01N27/333;G01N27/30 主分类号 G01N27/333
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