发明名称 CONTACT STRUCTURE FOR INSPECTION
摘要 A contact structure for inspection that is installed on a bottom surface of a circuit board includes a ground conductor that is grounded; an elastic contact member that is brought into contact with an inspection target object; and a conductive line that electrically connects the circuit board and the elastic contact member. Here, the elastic contact member may be provided on a bottom surface of the ground conductor that is grounded. The elastic contact member may include an insulating layer, a wiring layer, a contactor and an elastic body provided at a position corresponding to the contactor. The elastic body provides the elastic contact member with elasticity when the contactor is brought into contact with an electrode. The elastic contact member is provided in parallel with the ground conductor. The wiring layer and the ground conductor form a microstrip line.
申请公布号 KR20110018903(A) 申请公布日期 2011.02.24
申请号 KR20107028137 申请日期 2009.06.17
申请人 TOKYO ELECTRON LIMITED 发明人 MOCHIZUKI JUN
分类号 G01R1/073;H01L21/66 主分类号 G01R1/073
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