发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device with superior reliability. SOLUTION: The semiconductor device includes a high-side switching element having a first switching element, and a low-side switching element having a second switching element and a third switching element. The size of the second switching element is larger than that of the third switching element, and 0<(threshold voltage of third switching element)<(on voltage of internal diode of second switching element) is satisfied. When a potential at a connection point between the first switching element and second switching element becomes higher than -(threshold voltage of third switching element), the third switching element is turned off, and when the potential at the connection point becomes lower than -(threshold voltage of third switching element), the third switching element is turned on. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011040777(A) 申请公布日期 2011.02.24
申请号 JP20100227297 申请日期 2010.10.07
申请人 TOSHIBA CORP 发明人 NAKAMURA KAZUTOSHI;YASUHARA NORIO
分类号 H01L27/088;H01L21/822;H01L21/8234;H01L27/04;H02M3/155 主分类号 H01L27/088
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