| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a test measurement instrument capable of detecting a bit error. <P>SOLUTION: An input means 12 receives an input signal and outputs digitized data 14. A memory 18 accumulates digitized reference data containing a reference sequence. A pattern detector 16 detects the reference sequence from the digitized data 14 and generates a synchronization signal 20 correspondingly. The memory 18 outputs digitized reference data 22 in response to the synchronization signal by control of a memory controller 19. A comparator 24 compares the digitized reference data 22 from the memory with the digitized data 14. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
