| 摘要 |
PROBLEM TO BE SOLVED: To provide a magnetic particle inspection device having a high detection capability for shallow flaws by inspecting an inspection object during applying a rotating magnetic field. SOLUTION: The magnetic particle inspection device detects a flaw by magnetizing a surface layer of a running inspection object and scattering magnetic particles thereto, taking a picture of a surface of the inspection object forming a magnetic particle indicating texture at a flaw by a camera, and detecting the flaw by image-treating the taken image. The magnetic particle inspection device is equipped with: a magnetizing part generating the rotating magnetic field near the surface layer of the inspection object; and a detection part shading-correcting the image taken by the camera during generating the rotating magnetic field and detecting omnidirectional flaws. COPYRIGHT: (C)2011,JPO&INPIT |
