发明名称 CLEANING MODULE, EUV LITHOGRAPHY DEVICE AND METHOD FOR THE CLEANING THEREOF
摘要 In order to clean optical components (35) inside an EUV lithography device in a gentle manner, a cleaning module for an EUV lithography device includes a supply line for molecular hydrogen and a heating filament for producing atomic hydrogen and hydrogen ions for cleaning purposes. The cleaning module also has an element, (33) arranged to apply an electric and/or magnetic field, downstream of the heating filament (29) in the direction of flow of the hydrogen (31, 32). The element can be designed as a deflection unit, as a filter unit and/or as an acceleration unit for the ion beam (32).
申请公布号 US2011043774(A1) 申请公布日期 2011.02.24
申请号 US20100883247 申请日期 2010.09.16
申请人 CARL ZEISS SMT AG 发明人 HEMBACHER STEFAN;KRAUS DIETER;EHM DIRK HEINRICH;SCHMIDT STEFAN-WOLFGANG;KOEHLER STEFAN;CZAP ALMUT;WIESNER STEFAN;CHUNG HIN YIU ANTHONY
分类号 G03B27/52;G21G5/00 主分类号 G03B27/52
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