发明名称 MATERIAL ANALYSIS DEVICE BASED ON EDGE-EMITTER SEMICONDUCTOR LASER CHRYSTAL, AND ASSICIATED ANALYSIS TOOL
摘要 An edge-emitter semiconductor laser crystal having a receptacle for sample material which can influence the crystal's laser operation. There may be separate zones of laser action within the crystal, creating respective sensing zones in the receptacle. Detection may be achieved by providing photo-diode regions within the crystal, for example.
申请公布号 US2011043804(A1) 申请公布日期 2011.02.24
申请号 US20080746463 申请日期 2008.12.05
申请人 发明人 SUMMERS HUW;REES PAUL
分类号 G01N21/25;G01J1/42;H01S3/16 主分类号 G01N21/25
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