发明名称 ELECTROLYTIC POLISHING DEVICE OF SAMPLE FOR ANALYSIS
摘要 PROBLEM TO BE SOLVED: To provide an inexpensive electrolytic polishing device having a wide observation visual field of a sample by a transmission electron microscope, requiring an extremely small amount of electrolytic solution to be used, and reducing dramatically a load on an environment. SOLUTION: This device is equipped with: an observation mirror for observing a sample and/or the position of the tip of a rod-like electrode; a sample cell mounted detachably on a sample cell holding table, and having an opening part in a vertical direction, for holding uniformly the sample on the opening part, and holding a small amount of electrolytic solution; the rod-like electrode provided close to the sample as a counter electrode of the sample cell; a position adjusting means for adjusting an interval between the rod-like electrode and the sample; and a voltage application means for applying a voltage to the sample and the rod-like electrode. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011039017(A) 申请公布日期 2011.02.24
申请号 JP20090202052 申请日期 2009.08.10
申请人 CHEMICAL YAMAMOTO:KK;NAGOYA UNIV 发明人 YAMAMOTO MASATO;GOTO TAKUHIRO;SHIRAISHI YOSHIHIRO;AMANO MASAYUKI;SAKA KIMITAKA;SUZUKI TOSHIYUKI;TAKAHASHI TOMOSATO;NAKANO MIEKO
分类号 G01N1/32;C25F3/16;G01N1/28 主分类号 G01N1/32
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