发明名称 ESD PROTECTION STRUCTURE
摘要 An electrostatic discharge protection structure (10, 52) includes a first vertical bipolar junction transistor (58); a second vertical bipolar junction transistor (66), wherein the second vertical bipolar junction transistor has a common collector (16) with the first vertical bipolar junction transistor, and the common collector has a first conductivity; a horizontal bipolar junction (62) transistor wherein the collector (18, 22, 20, 24) of the horizontal bipolar junction transistor (62) has a second conductivity that is a different conductivity than the first conductivity, and the base (28) of the horizontal bipolar junction transistor is electrically coupled to the common collector of the first vertical bipolar junction transistor and the second vertical bipolar junction transistor; a first avalanche diode (60) electrically coupled to the base and the collector of the first vertical bipolar junction transistor (58); and a second avalanche diode (64) electrically coupled to the base and the collector of the second vertical bipolar junction transistor.
申请公布号 WO2010138326(A3) 申请公布日期 2011.02.24
申请号 WO2010US35090 申请日期 2010.05.17
申请人 FREESCALE SEMICONDUCTOR INC.;KUSHNER, VADIM A.;GENDRON, AMAURY;GILL, CHAI EAN E. 发明人 KUSHNER, VADIM A.;GENDRON, AMAURY;GILL, CHAI EAN E.
分类号 H01L27/04;H01L23/60 主分类号 H01L27/04
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